MISC

2011年4月

収差補正電子顕微鏡によるナノカーボン物質の構造評価

Journal of the Vacuum Society of Japan
  • 佐藤雄太
  • ,
  • 末永和知

54
4
開始ページ
264
終了ページ
269
記述言語
日本語
掲載種別
記事・総説・解説・論説等(学術雑誌)
DOI
10.3131/jvsj2.54.264
出版者・発行元
The Vacuum Society of Japan

Recent development of spherical aberration correctors for transmission electron microscopes (TEM) and scanning TEM (STEM) has enabled atomic-resolution imaging of nanocarbon materials even at relatively low electron acceleration voltages around and below 100 kV. In this article, we review some recent studies on carbon nanotubes (CNTs) and fullerene nanopeapods using aberration-corrected TEM/STEM. Local structure of each individual CNT can be visualized in details including point defects such as atomic vacancies and adatoms in aberration-corrected TEM images. Atomic-level structures of fullerene molecules and their orientation inside a CNT can be unambiguously observed. Identification of single metal atoms such as calcium and lanthanides in nanopeapods by using STEM-EELS operated at 60 kV is also presented.<br>

リンク情報
DOI
https://doi.org/10.3131/jvsj2.54.264 本文へのリンクあり
CiNii Articles
http://ci.nii.ac.jp/naid/10028260170
CiNii Books
http://ci.nii.ac.jp/ncid/AN00119871
URL
http://www.jstage.jst.go.jp/article/jvsj2/54/4/264/_pdf/-char/ja/
ID情報
  • DOI : 10.3131/jvsj2.54.264
  • ISSN : 1882-2398
  • ISSN : 1882-4749
  • CiNii Articles ID : 10028260170
  • CiNii Books ID : AN00119871

エクスポート
BibTeX RIS