安藤 淳

Monitoring conditions of cantilever during conducting atomic force microscopy spectroscopy measurements 

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 45(3B) 1934-1936 2006年3月  

Spatial fluctuation of dielectric properties in Hf-based high-k gate films studied by scanning capacitance microscopy 

APPLIED PHYSICS LETTERS 87(25) 252908-1-252908-3 2005年12月  

Electric transport measurement of a multi-walled carbon nanotube in scanning transmission electron microscope 

PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES 24(1-2) 37-41 2004年8月  

Simple thermal chemical vapor deposition synthesis and electrical property of multi-walled carbon nanotubes 

PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES 24(1-2) 14-18 2004年8月  

Improvement of electrical contact at carbon nanotube/Pt by selective electron irradiation 

PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES 24(1-2) 6-9 2004年8月  

Conductive-mode atomic force microscopy study of amorphous silicon nitride thin films 

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS 42(11A) L1321-L1323 2003年11月  

Topography and local electrical properties of nondoped polycrystalline silicon thin films evaluated using conductive-mode atomic force microscopy 

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS 42(11A) L1302-L1304 2003年11月  

Conducting-AFM spectroscopy on ultrathin SiO(2) films 

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 72 S223-S226 2001年4月