井藤浩志 (Hiroshi Itoh) - マイポータル

基本情報

外部リンク: http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=H17552864

Tip characterizer for atomic force microscopy

Hiroshi Itoh, Toshiyuki Fujimoto, Shingo Ichimura

REVIEW OF SCIENTIFIC INSTRUMENTS 77(10) 103704-103707 2006年10月
XPS study of silicon surface after ultra-low-energy ion implantation

Kazuhiro Yamamoto, Hiroshi Itoh

SURFACE SCIENCE 600(18) 3753-3756 2006年9月
Secondary ion mass spectrometry of organic thin films using metal-cluster-complex ion source

Yukio Fujiwara, Kouji Kondou, Hidehiko Nonaka, Naoaki Saito, Hiroshi Itoh, Toshiyuki Fujimoto, Akira Kurokawa, Shingo Ichimura, Mitsuhiro Tomita

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS 45(33-36) L987-L990 2006年9月
Initial oxidation process by ozone on Si(100) investigated by scanning tunneling microscopy

H Itoh, K Nakamura, A Kurokawa, S Ichimura

SURFACE SCIENCE 482(Pt.1) 114-120 2001年6月
Atomic force microscopy observation of layer-by-layer growth of ultrathin silicon dioxide by ozone gas at room temperature

MAEDA T, KUROKAWA A, SAKAMOTO K, ANDO A, ITOH H, ICHIMURA S

J. Vac. Sci. Technol. B 19(2) 589-592 2001年