論文

査読有り
2019年

Germanium Layer Transfer with Low Temperature Direct Bonding and Epitaxial Lift-off Technique for Ge-based monolithic 3D integration

2019 SILICON NANOELECTRONICS WORKSHOP (SNW)
  • Tatsuro Maeda
  • ,
  • Hiroyuki Ishii
  • ,
  • Wen Hsin Chang
  • ,
  • Toshifumi Irisawa
  • ,
  • Yuichi Kurashima
  • ,
  • Hideki Takagi
  • ,
  • Noriyuki Uchida

開始ページ
9
終了ページ
10
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
出版者・発行元
IEEE

We demonstrated high-quality single crystal Germanium (Ge) layer transferred on arbitrary substrates, such as Si, glass, and flexible plastic substrates utilizing direct bonding and epitaxial lift-off (ELO) techniques. Owing to Ge epitaxial growth on GaAs substrates with AlAs release layer, we successfully transferred epitaxial Ge layers on arbitrary substrates with a wide range of thickness from several um to 1 nm. This layer tranfer approach enables us to realize Ge-based monolithic 3D devices without degradation of Ge crystalline quality.

リンク情報
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000501001400004&DestApp=WOS_CPL
ID情報
  • ISSN : 2161-4636
  • Web of Science ID : WOS:000501001400004

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