論文

査読有り
2017年5月

Effect of a radical exposure nitridation surface on the charge stability of shallow nitrogen-vacancy centers in diamond

APPLIED PHYSICS EXPRESS
  • Taisuke Kageura
  • Kanami Kato
  • Hayate Yamano
  • Evi Suaebah
  • Miki Kajiya
  • Sora Kawai
  • Masafumi Inaba
  • Takashi Tanii
  • Moriyoshi Haruyama
  • Keisuke Yamada
  • Shinobu Onoda
  • Wataru Kada
  • Osamu Hanaizumi
  • Tokuyuki Teraji
  • Junichi Isoya
  • Shozo Kono
  • Hiroshi Kawarada
  • 全て表示

10
5
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.7567/APEX.10.055503
出版者・発行元
IOP PUBLISHING LTD

A nitridation process of a diamond surface with nitrogen radical exposure far from the radio-frequency plasma for the stabilization of a negatively charged nitrogen-vacancy (NV%) centers near the surface is presented. At a nitrogen coverage of as high as 0.9 monolayers, high average Rabi contrasts of 0.40 +/- 0.06 and 0.46 +/- 0.03 have been obtained for single NV% centers formed by shallow nitrogen implantation with acceleration voltages of 1 and 2 keV, respectively. This indicates that nitrogen termination by a radical exposure process produces an electric charge state suitable for single NV- centers near the surface compared with the states obtained for alternatively terminated surfaces. (C) 2017 The Japan Society of Applied Physics

リンク情報
DOI
https://doi.org/10.7567/APEX.10.055503
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000399121100001&DestApp=WOS_CPL
ID情報
  • DOI : 10.7567/APEX.10.055503
  • ISSN : 1882-0778
  • eISSN : 1882-0786
  • Web of Science ID : WOS:000399121100001

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