論文

査読有り
2012年1月

Multi-Parametric Profiling Network Based on Gene Expression and Phenotype Data: A Novel Approach to Developmental Neurotoxicity Testing

INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES
  • Reiko Nagano
  • ,
  • Hiromi Akanuma
  • ,
  • Xian-Yang Qin
  • ,
  • Satoshi Imanishi
  • ,
  • Hiroyoshi Toyoshiba
  • ,
  • Jun Yoshinaga
  • ,
  • Seiichiroh Ohsako
  • ,
  • Hideko Sone

13
1
開始ページ
187
終了ページ
207
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.3390/ijms13010187
出版者・発行元
MDPI AG

The establishment of more efficient approaches for developmental neurotoxicity testing (DNT) has been an emerging issue for children's environmental health. Here we describe a systematic approach for DNT using the neuronal differentiation of mouse embryonic stem cells (mESCs) as a model of fetal programming. During embryoid body (EB) formation, mESCs were exposed to 12 chemicals for 24 h and then global gene expression profiling was performed using whole genome microarray analysis. Gene expression signatures for seven kinds of gene sets related to neuronal development and neuronal diseases were selected for further analysis. At the later stages of neuronal cell differentiation from EBs, neuronal phenotypic parameters were determined using a high-content image analyzer. Bayesian network analysis was then performed based on global gene expression and neuronal phenotypic data to generate comprehensive networks with a linkage between early events and later effects. Furthermore, the probability distribution values for the strength of the linkage between parameters in each network was calculated and then used in principal component analysis. The characterization of chemicals according to their neurotoxic potential reveals that the multi-parametric analysis based on phenotype and gene expression profiling during neuronal differentiation of mESCs can provide a useful tool to monitor fetal programming and to predict developmentally neurotoxic compounds.

リンク情報
DOI
https://doi.org/10.3390/ijms13010187
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000300184800013&DestApp=WOS_CPL
ID情報
  • DOI : 10.3390/ijms13010187
  • ISSN : 1661-6596
  • Web of Science ID : WOS:000300184800013

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