論文

査読有り 本文へのリンクあり
2019年

Investigation of TSV Liner Interface with Multiwell Structured TSV to Suppress Noise Propagation in Mixed-Signal 3D-IC

IEEE Journal of the Electron Devices Society
  • Hisashi Kino
  • ,
  • Takafumi Fukusima
  • ,
  • Tetsu Tanaka

7
開始ページ
1225
終了ページ
1231
記述言語
掲載種別
研究論文(学術雑誌)
DOI
10.1109/JEDS.2019.2936180

© 2013 IEEE. Mixed-signal 3D-ICs have a stacked structure of digital and analog circuit chips. In this study, the effect of noise propagation from a digital circuit on an analog circuit was evaluated using an actual mixed-signal 3D-IC. The noise propagation via through-silicon vias (TSVs) was measured, with a ring-oscillator as a noise source. For a comprehensive investigation, TSV-liner interface states were evaluated along the depth direction using unique multiwell-structured TSVs and a charge-pumping method. It was considered that the interface traps and nonconformal thickness of the TSV liner increased the noise propagation among stacked chips.

リンク情報
DOI
https://doi.org/10.1109/JEDS.2019.2936180
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85076552105&origin=inward 本文へのリンクあり
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https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85076552105&origin=inward
ID情報
  • DOI : 10.1109/JEDS.2019.2936180
  • eISSN : 2168-6734
  • SCOPUS ID : 85076552105

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