MISC

2006年10月

Low-frequency eddy current imaging using mr sensor detecting tangential magnetic field components for nondestructive evaluation

IEEE Transactions on Magnetics
  • Keiji Tsukada
  • ,
  • Toshihiko Kiwa
  • ,
  • Tomoaki Kawata
  • ,
  • Yudai Ishihara

42
10
開始ページ
3315
終了ページ
3317
記述言語
英語
掲載種別
DOI
10.1109/TMAG.2006.879754
出版者・発行元
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

An eddy-current distribution imaging system using a wide-area magnetic field exposure has been developed. This system can be employed to detect deep metal cracks using a magnetic resistive (MR) sensor. The measuring system consists of the exposure coil, MR sensors, measuring circuits, lock-in amplifier, xy stage, and a personal computer. To detect the eddy current distribution, the imaging system uses a pair of MR sensors that detect the x and y magnetic field components parallel to the metal surface. The system operates at a low-frequency range in order to obtain depth of penetration. An artificial defect consisting of a multilayer A1 substrate sample with a bottom half slit was measured to test the system. The change in the eddy current distribution image due to the presence of the flaw was obtained. In particular, it was determined that the detection of the slit depth was improved by this lower exposure frequency. © 2006, IEEE. All rights reserved.

リンク情報
DOI
https://doi.org/10.1109/TMAG.2006.879754
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000240888700349&DestApp=WOS_CPL
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85008044207&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85008044207&origin=inward
ID情報
  • DOI : 10.1109/TMAG.2006.879754
  • ISSN : 0018-9464
  • eISSN : 1941-0069
  • SCOPUS ID : 85008044207
  • Web of Science ID : WOS:000240888700349

エクスポート
BibTeX RIS