MISC

2009年10月

Magnetic thickness gauge using a Fourier transformed eddy current technique

NDT and E International
  • Toshihiko Kiwa
  • ,
  • Takayuki Hayashi
  • ,
  • Yoshihiko Kawasaki
  • ,
  • Hironobu Yamada
  • ,
  • Keiji Tsukada

42
7
開始ページ
606
終了ページ
609
記述言語
英語
掲載種別
DOI
10.1016/j.ndteint.2009.04.003
出版者・発行元
ELSEVIER SCI LTD

A Fourier-transformed eddy current (FTEC) technique has been proposed and developed. This technique employs Fourier transformation analysis to analyze pulsed eddy current signals measured by magnetoresistive sensors. The advantage of this technique is that the intrinsic response, Gamp (f), of a sample material can be extracted without it being affected by the characteristics of the measurement systems. Aluminum plates with an area of 100 mm × 100 mm and various thicknesses were used as test samples. We examined the relationship between the thickness of the sample and the frequency, when Gamp (f)'s reached 90% of the maximum magnitude. The results indicate that FTEC can be used for non-contact measurements of conductive materials. We also evaluated lift-off effects for Gamp (f) for 1- and 5-mm-thick samples. The deviations of the frequencies for the 90% response were 453.386 ± 14.37 and 99.789 ± 4.13 Hz for the 1- and 5-mm-thick samples, respectively. This result indicates that the lift-off effect was reduced by the FTEC analysis. © 2009 Elsevier Ltd. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.ndteint.2009.04.003
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000268783100005&DestApp=WOS_CPL
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=67650088601&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=67650088601&origin=inward
ID情報
  • DOI : 10.1016/j.ndteint.2009.04.003
  • ISSN : 0963-8695
  • SCOPUS ID : 67650088601
  • Web of Science ID : WOS:000268783100005

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