2014年10月20日
21pm1-A3 金ナノ粒子の電界トラップを用いた自己修復配線の粒径依存性
マイクロ・ナノ工学シンポジウム
- ,
- 巻
- 2014
- 号
- 6
- 開始ページ
- "21pm1
- 終了ページ
- A3-1"-"21pm1-A3-2"
- 記述言語
- 日本語
- 掲載種別
- 出版者・発行元
- 一般社団法人日本機械学会
On a self-healing wire using an electric field trapping of gold nanoparticles, we examined a particle size dependence of a healing voltage by comparing 20 nm and 200 nm in particle radii. We fabricated the gold wires with a patterned crack on a glass substrate, and measured the healing voltages. As a result, in the each case of 20 nm and 200 nm in particle radii, cracks up to 1000 nm were healed by applying under 3.2 V in amplitude of AC voltage, and cracks up to 3500 nm were healed by applying under 4.0 V in amplitude of AC voltage, respectively. This result shows that the case of 200 nm in particle radius can heal a larger crack by applying the same voltage than the case of 20 nm in particle radius.
- リンク情報
-
- CiNii Articles
- http://ci.nii.ac.jp/naid/110009950672
- CiNii Books
- http://ci.nii.ac.jp/ncid/AA12456946
- ID情報
-
- CiNii Articles ID : 110009950672
- CiNii Books ID : AA12456946