MISC

2014年10月20日

21pm1-A3 金ナノ粒子の電界トラップを用いた自己修復配線の粒径依存性

マイクロ・ナノ工学シンポジウム
  • 古志 知也
  • ,
  • 岩瀬 英治

2014
6
開始ページ
"21pm1
終了ページ
A3-1"-"21pm1-A3-2"
記述言語
日本語
掲載種別
出版者・発行元
一般社団法人日本機械学会

On a self-healing wire using an electric field trapping of gold nanoparticles, we examined a particle size dependence of a healing voltage by comparing 20 nm and 200 nm in particle radii. We fabricated the gold wires with a patterned crack on a glass substrate, and measured the healing voltages. As a result, in the each case of 20 nm and 200 nm in particle radii, cracks up to 1000 nm were healed by applying under 3.2 V in amplitude of AC voltage, and cracks up to 3500 nm were healed by applying under 4.0 V in amplitude of AC voltage, respectively. This result shows that the case of 200 nm in particle radius can heal a larger crack by applying the same voltage than the case of 20 nm in particle radius.

リンク情報
CiNii Articles
http://ci.nii.ac.jp/naid/110009950672
CiNii Books
http://ci.nii.ac.jp/ncid/AA12456946
ID情報
  • CiNii Articles ID : 110009950672
  • CiNii Books ID : AA12456946

エクスポート
BibTeX RIS