2004年9月
Technique to diagnose open defects that takes coupling effects into consideration
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
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- 巻
- E87D
- 号
- 9
- 開始ページ
- 2179
- 終了ページ
- 2185
- 記述言語
- 英語
- 掲載種別
- 出版者・発行元
- IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
Although open defects are hard to diagnose because they are unstable, we developed a technique to diagnose completely open defects. We applied a new "segment model" that takes the coupling effects on a defective node that are caused by neighboring nodes into consideration. This technique is used to focuse not only on the behavior of the defective node, but also on the behavior of other nodes affecting its behavior. We explain the theoretical treatment of our model and present experimental results obtained from an actual chip.
- リンク情報
- ID情報
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- ISSN : 1745-1361
- Web of Science ID : WOS:000223794900003