論文

査読有り 責任著者
2016年2月

Improvement of on/off ratio in organic field-effect transistor with carrier generation layer using oblique deposition

JAPANESE JOURNAL OF APPLIED PHYSICS
  • Hidetsugu Tamura
  • ,
  • Masahiro Minagawa
  • ,
  • Akira Baba
  • ,
  • Kazunari Shinbo
  • ,
  • Keizo Kato
  • ,
  • Futao Kaneko

55
2
開始ページ
02BB06.1
終了ページ
02BB06.4
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.7567/JJAP.55.02BB06
出版者・発行元
IOP PUBLISHING LTD

Improvement of the on/off ratio in carrier-generation type organic field-effect transistors with pentacene and MoO3 layers was attempted using oblique deposition. A MoO3 layer was formed only between the gold (Au) source and the drain electrodes, and devices with a MoO3 layer evaporated under various deposition angles were fabricated. A formation of a MoO3-free area is expected adjacent to the source or drain electrode by the oblique deposition. The off-current in the device decreased and the on/off ratio was increased with increasing deposition angle, and we achieved a fabricating device with a MoO3 layer having high on/off ratio, almost the same as that of the device without the MoO3 layer. From those results, we deduced that charge-transfer (CT) complexes at the pentacene/MoO3 interface formed a high-conductive path for the off-current, and the off-current was reduced by the formation of a highly-resistive MoO3-free area between electrodes. Therefore, controlling the CT complex layer formation by patterning the MoO3 layer can reduce the amount of off-current and improve the on/off ratio. (C) 2016 The Japan Society of Applied Physics

リンク情報
DOI
https://doi.org/10.7567/JJAP.55.02BB06
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000369217000008&DestApp=WOS_CPL
ID情報
  • DOI : 10.7567/JJAP.55.02BB06
  • ISSN : 0021-4922
  • eISSN : 1347-4065
  • Web of Science ID : WOS:000369217000008

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