論文

査読有り
2017年7月

Resistive switching mechanism of GeTe-Sb2Te3 interfacial phase change memory and topological properties of embedded two-dimensional states

NANOSCALE
  • Hisao Nakamura
  • ,
  • Ivan Rungger
  • ,
  • Stefano Sanvito
  • ,
  • Nobuki Inoue
  • ,
  • Junji Tominaga
  • ,
  • Yoshihiro Asai

9
27
開始ページ
9386
終了ページ
9395
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1039/c7nr03495d
出版者・発行元
ROYAL SOC CHEMISTRY

A theoretical study of an interfacial phase change memory made of a GeTe-Sb2Te3 superlattice with W electrodes is presented to identify the high and low resistance states and the switching mechanism. The ferro structure of the GeTe layer block in the Te-Ge-Te-Ge sequence can be in the low resistance state only if the SET/RESET mode consists of a two step dynamical process, corresponding to a vertical flip of the Ge layer with respect to the Te layer, followed by lateral motion driven by thermal relaxation. The importance of spin-orbit coupling at the GeTe/Sb2Te3 interface to the "bias polarity-dependent" SET/RESET operation is shown, and an analysis of the two-dimensional states confined at the GeTe/Sb2Te3 interface inside the resistive switching layer is presented. Our results allow us to propose a phase diagram for the transition from a topologically nontrivial to a trivial gap state of these two-dimensional compounds.

リンク情報
DOI
https://doi.org/10.1039/c7nr03495d
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000405387100016&DestApp=WOS_CPL
URL
http://orcid.org/0000-0001-5075-9451
ID情報
  • DOI : 10.1039/c7nr03495d
  • ISSN : 2040-3364
  • eISSN : 2040-3372
  • ORCIDのPut Code : 51221031
  • Web of Science ID : WOS:000405387100016

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