MISC

2012年

Preparation and Characterization of High Quality Lead-free BiFeO3 Thin Films by Sputtering Process

PROCEEDINGS OF THE 2012 FIFTH INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING AND TECHNOLOGY (ICETET 2012)
  • Seiji Nakashima
  • ,
  • Yusuke Takada
  • ,
  • Taiki Ito
  • ,
  • Syota Seto
  • ,
  • Hironori Fujisawa
  • ,
  • Masafumi Kobune
  • ,
  • Masaru Shimizu

開始ページ
128
終了ページ
131
記述言語
英語
掲載種別
DOI
10.1109/ICETET.2012.12
出版者・発行元
IEEE

BiFeO3 (BFO) thin films have been prepared on SrTiO3 (001) single crystal substrates by sputtering process which is suitable for mass production. Domain structure can be controlled by off-cut angle and direction of SrTiO3 substrates. A lateral PFM and a XRD reciprocal space mapping results reveal the BFO thin film on SrTiO3 (001) with 4 degrees off-cut along [110] is single domain. The single domain BFO shows well-saturated ferroelectric D-E hysteresis loops at R.T.

リンク情報
DOI
https://doi.org/10.1109/ICETET.2012.12
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000321507300026&DestApp=WOS_CPL
URL
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84876566056&origin=inward
ID情報
  • DOI : 10.1109/ICETET.2012.12
  • ISSN : 2157-0477
  • SCOPUS ID : 84876566056
  • Web of Science ID : WOS:000321507300026

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