論文

査読有り
2017年10月

Self-regulation of Bi/(Bi+Fe) ratio in metalorganic chemical vapor deposition of BiFeO<inf>3</inf>thin films

Japanese Journal of Applied Physics
  • Hironori Fujisawa
  • ,
  • Hironori Fujisawa
  • ,
  • Hironori Fujisawa
  • ,
  • Nao Yoshimura
  • ,
  • Seiji Nakashima
  • ,
  • Seiji Nakashima
  • ,
  • Seiji Nakashima
  • ,
  • Masaru Shimizu
  • ,
  • Masaru Shimizu

56
10
記述言語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.7567/JJAP.56.10PF05

© 2017 The Japan Society of Applied Physics. Metalorganic chemical vapor deposition (MOCVD) is one of the suitable techniques for practical applications of BiFeO3films. To develop the potential of MOCVD as a device fabrication process, we investigated the relationship between the film and gas compositions, and the growth under highly oxidizing conditions using O2 and O3gases. In the growth of epitaxial BiFeO3thin films on SrRuO3-covered 4° vicinal SrTiO3(001) at 620 °C, the self-regulation of the film composition was achieved for Bi and Fe precursor supply ratios between 62.1 to 78.5% under O2and 56.1 to 73.2-under 5 wt-O3-mixed O2 atmospheres. The leakage was very sensitive to the precursor supply ratio and oxidizing gas. 150-nm-thick MOCVDBiFeO3films grown using O2+O3gas showed the minimum leakage current density of 2.3 × 10-7A/cm2at +1 V. The highly oxidizing growth conditions using O3can suppress the leakage while precise composition control is required.

リンク情報
DOI
https://doi.org/10.7567/JJAP.56.10PF05
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85032876098&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85032876098&origin=inward
ID情報
  • DOI : 10.7567/JJAP.56.10PF05
  • ISSN : 0021-4922
  • eISSN : 1347-4065
  • SCOPUS ID : 85032876098

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