佐藤 和久

Kazuhisa Sato received his Ph.D degree in Materials Science from Osaka University, Japan (2005). Now he is a faculty member of the Research Center for Ultra-High Voltage Electron Microscopy, Osaka University (October 2015–present). His research activities focus on atomic structures, lattice defetcs, and phase transition of nanostructured materials and metals/inorganic solids by means of advanced electron microscopy techniques, including high-voltage electron microscopy (HVEM), aberration-corrected (scanning) transmission electron microscopy (AC-STEM/TEM), electron tomography (3D-ET), low-voltage scanning electron microscopy (SEM), and image simulations. In recent years he has also embarked on photoelectron spectroscopy using synchrotron radiation to elucidate defect processes in solids via excitation, in view of developing a novel solid phase reaction that utilize electronic excitation. He is the author of 154 refereed papers (including 53 first autor papers). His honors include Osaka University Prize (2019), the Japan Institute of Metals and Materials Meritorious Award (2019), the Murakami Young Researcher Award (2013), and the Japanese Society for Microscopy Young Researcher Award (2012).

専門分野：材料科学、電子顕微鏡
ナノマテリアルを含む金属・無機固体材料の電子線構造解析に従事。原子的構造・微細組織と機能発現メカニズムとの関わりとともに、新しい構造物性評価法の開拓に関心を持つ。

資格：第１種放射線取扱主任者、甲種危険物取扱者、高圧ガス製造保安責任者(乙種機械)、エックス線作業主任者