論文

査読有り
2003年12月

Importance of fourth-order zero-field splitting terms in random-orientation EPR spectra of Eu(II)-doped strontium aluminate

JOURNAL OF PHYSICAL CHEMISTRY A
  • H Matsuoka
  • ,
  • K Furukawa
  • ,
  • K Sato
  • ,
  • D Shiomi
  • ,
  • Y Kojima
  • ,
  • K Hirotsu
  • ,
  • N Furuno
  • ,
  • T Kato
  • ,
  • T Takui

107
51
開始ページ
11539
終了ページ
11546
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1021/jp030819
出版者・発行元
AMER CHEMICAL SOC

This work discusses an issue caused by omitting the fourth-order zero-field splitting (ZFS) terms in the analysis of random-orientation EPR spectra. Eu(II)-doped strontium aluminates were employed as a model system of the S-state lanthanoid ions, which have relatively large second-rank ZFS components, comparable to the conventional X-band microwave energy. The initial estimation of second- and fourth-rank ZFS components was acquired uniquely from the W-band spectrum based on a perturbation treatment of the spin Hamiltonian, and they were refined by a hybrid-eigenfield simulation approach. A parallel simulation of the X- and W-band spectra with the refined parameters reasonably reproduced both the observed spectra. The reliability of the parameters was also verified by reproducing the off-principal-axis extra lines arising from the M-S = 1/2 <----> 1/2 transition observed in the W-band spectrum. By comparison with an analysis based on the spin Hamiltonian omitting the fourth-order terms, it was concluded that omitting these terms results in an erroneous determination of the rhombic parameter (E) of the second-rank ZFS tensor. The obtained reliable second-rank ZFS tensors enabled us to invoke the superposition model, determining their principal-axis orientation. This is the first report of such relative orientation determined for Eu(II)-doped strontium aluminates.

リンク情報
DOI
https://doi.org/10.1021/jp030819
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000187446900034&DestApp=WOS_CPL
ID情報
  • DOI : 10.1021/jp030819
  • ISSN : 1089-5639
  • Web of Science ID : WOS:000187446900034

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