HARA Yasuhiko

J-GLOBAL         Last updated: Jul 27, 2019 at 12:28
 
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Name
HARA Yasuhiko
Affiliation
Nihon University
Section
College of Engineering Department of Computer Science
Degree
MS(Tokyo Institute of Technology), Ph.D(The University of Tokyo)

Research Areas

 
 

Academic & Professional Experience

 
 
   
 
Professor, Nihon University College of Engineering Department of Computer Science
 

Education

 
Sep 1973
 - 
Jul 1974
Electric Engineering, Graduate School, Carnegie-Mellon University
 
 
 - 
1970
Graduate School, Division of Science and Engineering, Tokyo Institute of Technology
 
 
 - 
1968
Faculty of Science, Science University of Tokyo
 

Committee Memberships

 
2000
   
 
Asia International Symposium on Mechatronics(AISM),  International Program Committee Member
 
1996
   
 
Int. Conf. on Quality Control by Artificial Vision  International Scientific Committee Member
 
1996
   
 
IEEE Workshop on Applications of Computer Vision  Organizing Committee Member
 
2006
   
 
Europe-Asia Congress on Mechatronics  
 
1996
 - 
2005
France-Japan Congress on Mechatronics  
 

Misc

 
Doi Hideaki, Hara Yasuhiko, Kitamura Shigeki, Furutani Takashi
37(3) 1554-1555   Sep 1988
HARA Yasuhiko
Journal of the Japan Society of Precision Engineering   56(1)    Jan 1990
SUGINO Hiroshi
Journal of the Japan Society of Precision Engineering   56(1) 54-55   Jan 1990
HARA Yasuhiko, DOI Hideaki, NUMATA Kiyoshi, ENDO Kenzo, SHINADA Satoshi
Journal of the Japan Society of Precision Engineering   56(5) 837-842   May 1990
This paper describes a system which automatically inspects defects in plated through-holes formed in muti-layer printed circuit boards. These defects are the type of which a part of copper is lacking on the wall of the plated through-hole. In orde...
HARA Yasuhiko
Journal of the Japan Society of Precision Engineering   56(8) 1381-1385   Aug 1990

Works

 
Inspecting solder balls on semiconductor mater
2000 - 2000

Research Grants & Projects

 
Development of Measuring Technology for Electrinic Products
Project Year: 2011   
Study on Antomatic Recognition of Defects in Circuit Patterns