MISC

2007年1月

Nanomechanical mapping of carbon black reinforced natural rubber by atomic force microscopy

CHINESE JOURNAL OF POLYMER SCIENCE
  • Toshio Nishi
  • ,
  • Hideyuki Nukaga
  • ,
  • So Fujinami
  • ,
  • Ken Nakajima

25
1
開始ページ
35
終了ページ
41
記述言語
英語
掲載種別
DOI
10.1142/S0256767907001820
出版者・発行元
WORLD SCIENTIFIC PUBL CO PTE LTD

Atomic force microscopy (AFM) has the advantage of obtaining mechanical properties as well as topographic information at the same time. By analyzing force-distance curves measured over two-dimensional area using Hertzian contact mechanics, Young's modulus mapping was obtained with nanometer-scale resolution. Furthermore, the sample deformation by the force exerted was also estimated from the force-distance curve analyses. We could thus reconstruct a real topographic image by incorporating apparent topographic image with deformation image. We applied this method to carbon black reinforced natural rubber to obtain Young's modulus distribution image together with reconstructed real topographic image. Then we were able to recognize three regions; rubber matrix, carbon black (or bound rubber) and intermediate regions. Though the existence of these regions had been investigated by pulsed nuclear magnetic resonance, this paper would be the first to report on the quantitative evaluation of the interfacial region in real space.

リンク情報
DOI
https://doi.org/10.1142/S0256767907001820
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000250833400005&DestApp=WOS_CPL
ID情報
  • DOI : 10.1142/S0256767907001820
  • ISSN : 0256-7679
  • Web of Science ID : WOS:000250833400005

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