論文

2018年6月1日

High-sensitivity visualization of localized electric fields using low-energy electron beam deflection

Japanese Journal of Applied Physics
  • Samuel Jeong
  • ,
  • Yoshikazu Ito
  • ,
  • Gary Edwards
  • ,
  • Jun-Ichi Fujita

57
6
開始ページ
65201
終了ページ
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.7567/JJAP.57.065201
出版者・発行元
Japan Society of Applied Physics

The visualization of localized electronic charges on nanocatalysts is expected to yield fundamental information about catalytic reaction mechanisms. We have developed a high-sensitivity detection technique for the visualization of localized charges on a catalyst and their corresponding electric field distribution, using a low-energy beam of 1 to 5 keV electrons and a high-sensitivity scanning transmission electron microscope (STEM) detector. The highest sensitivity for visualizing a localized electric field was ∼0.08 V/μm at a distance of ∼17μm from a localized charge at 1 keV of the primary electron energy, and a weak local electric field produced by 200 electrons accumulated on the carbon nanotube (CNT) apex can be visualized. We also observed that Au nanoparticles distributed on a CNT forest tended to accumulate a certain amount of charges, about 150 electrons, at a %2 V bias.

リンク情報
DOI
https://doi.org/10.7567/JJAP.57.065201
ID情報
  • DOI : 10.7567/JJAP.57.065201
  • ISSN : 1347-4065
  • ISSN : 0021-4922
  • SCOPUS ID : 85047931297

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