Jun 1, 2018
High-sensitivity visualization of localized electric fields using low-energy electron beam deflection
Japanese Journal of Applied Physics
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- Volume
- 57
- Number
- 6
- First page
- 65201
- Last page
- Language
- English
- Publishing type
- Research paper (scientific journal)
- DOI
- 10.7567/JJAP.57.065201
- Publisher
- Japan Society of Applied Physics
The visualization of localized electronic charges on nanocatalysts is expected to yield fundamental information about catalytic reaction mechanisms. We have developed a high-sensitivity detection technique for the visualization of localized charges on a catalyst and their corresponding electric field distribution, using a low-energy beam of 1 to 5 keV electrons and a high-sensitivity scanning transmission electron microscope (STEM) detector. The highest sensitivity for visualizing a localized electric field was ∼0.08 V/μm at a distance of ∼17μm from a localized charge at 1 keV of the primary electron energy, and a weak local electric field produced by 200 electrons accumulated on the carbon nanotube (CNT) apex can be visualized. We also observed that Au nanoparticles distributed on a CNT forest tended to accumulate a certain amount of charges, about 150 electrons, at a %2 V bias.
- Link information
- ID information
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- DOI : 10.7567/JJAP.57.065201
- ISSN : 1347-4065
- ISSN : 0021-4922
- SCOPUS ID : 85047931297