論文

査読有り
2013年1月

Damage and strain in single-layer graphene induced by very-low-energy electron-beam irradiation

APPLIED PHYSICS LETTERS
  • Katsuhisa Murakami
  • ,
  • Takuya Kadowaki
  • ,
  • Jun-ichi Fujita

102
4
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1063/1.4790388
出版者・発行元
AMER INST PHYSICS

From the analysis of the ratio of D peak intensity to G peak intensity in Raman spectroscopy, electron beam irradiation with energies of 100 eV was found to induce damage in single-layer graphene. The damage becomes larger with decreasing electron beam energy. Internal strain in graphene induced by damage under irradiation is further evaluated based on G peak shifts. The dose-dependent internal strain was approximately 2.22% cm(2)/mC at 100 eV and 2.65 x 10(-2)% cm(2)/mC at 500 eV. The strain induced by the irradiation showed strong dependence on electron energy. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4790388]

Web of Science ® 被引用回数 : 24

リンク情報
DOI
https://doi.org/10.1063/1.4790388
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000314723600079&DestApp=WOS_CPL
ID情報
  • DOI : 10.1063/1.4790388
  • ISSN : 0003-6951
  • Web of Science ID : WOS:000314723600079

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