論文

査読有り
2004年9月

Enhanced electron-capture decay rate of Be-7 encapsulated in C-60 cages

PHYSICAL REVIEW LETTERS
  • T Ohtsuki
  • ,
  • H Yuki
  • ,
  • M Muto
  • ,
  • J Kasagi
  • ,
  • K Ohno

93
11
開始ページ
112501-1-112501-4
終了ページ
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1103/PhysRevLett.93.112501
出版者・発行元
AMERICAN PHYSICAL SOC

The decay rate of Be-7 electron capture was measured in C-60 and Be metal with a reference method. The half-life of Be-7 endohedral C-60 (Be-7@C-60) and Be-7 in Be metal (Be metal (Be-7)) is found to be 52.68+/-0.05 and 53.12+/-0.05 days, respectively. This amounts to a 0.83% difference in electron-capture decay half-life between Be-7@C-60 and Be metal (Be-7). Our result is a reflection of the different electron wave functions for Be-7@C-60 inside C-60 compared to the situation when Be-7 is in a Be metal.

リンク情報
DOI
https://doi.org/10.1103/PhysRevLett.93.112501
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000223794400012&DestApp=WOS_CPL
ID情報
  • DOI : 10.1103/PhysRevLett.93.112501
  • ISSN : 0031-9007
  • Web of Science ID : WOS:000223794400012

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