2001年7月
Scanning tunneling microscopy, X-ray photoelectron spectroscopy and electron energy-loss spectroscopy studies of the misfit layer compounds {(Pb1-xSbxS)(1+y)}(m)TS2 (T = Ti and Nb; m = 1 and 2)
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
- ,
- 巻
- 70
- 号
- 7
- 開始ページ
- 2082
- 終了ページ
- 2091
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1143/JPSJ.70.2082
- 出版者・発行元
- PHYSICAL SOC JAPAN
The misfit-layer compounds {Pb1-xSbxS)(1-y)}(m)TS2 (T=Ti and Nb: m = 1 and 2) are constructed of the regular stacking of single or double two-atom-thick Pb1-xSbxS (Q) layers and a three-atom-thick TS2 (H) layer. They are studied by means of the scanning tunneling microscope (STM) and the x-ray photoelectron spectroscopy (XPS) and the electron-energy-loss spectroscopy (EELS) methods. For the 2Q/1H (m = 2) compounds, atomic-scale STM images are obtained from both the Q and H layers, whereas for the 1Q/1H compounds no STM images are obtained from a Q layer even if a Q layer consists of a (Pb,Sb)S layer. The electronic structures of the 2Q/1H compounds as well as the 1Q/1H compounds are discussed. It is found that as m increases, the x-ray photoemission threshold or the Fermi energy position shifts to lower binding energy by charge transfer from a Q layer.
- リンク情報
- ID情報
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- DOI : 10.1143/JPSJ.70.2082
- ISSN : 0031-9015
- CiNii Articles ID : 10009119622
- Web of Science ID : WOS:000170077600038