MISC

2001年7月

Scanning tunneling microscopy, X-ray photoelectron spectroscopy and electron energy-loss spectroscopy studies of the misfit layer compounds {(Pb1-xSbxS)(1+y)}(m)TS2 (T = Ti and Nb; m = 1 and 2)

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
  • Y Ohno
  • ,
  • T Wada

70
7
開始ページ
2082
終了ページ
2091
記述言語
英語
掲載種別
DOI
10.1143/JPSJ.70.2082
出版者・発行元
PHYSICAL SOC JAPAN

The misfit-layer compounds {Pb1-xSbxS)(1-y)}(m)TS2 (T=Ti and Nb: m = 1 and 2) are constructed of the regular stacking of single or double two-atom-thick Pb1-xSbxS (Q) layers and a three-atom-thick TS2 (H) layer. They are studied by means of the scanning tunneling microscope (STM) and the x-ray photoelectron spectroscopy (XPS) and the electron-energy-loss spectroscopy (EELS) methods. For the 2Q/1H (m = 2) compounds, atomic-scale STM images are obtained from both the Q and H layers, whereas for the 1Q/1H compounds no STM images are obtained from a Q layer even if a Q layer consists of a (Pb,Sb)S layer. The electronic structures of the 2Q/1H compounds as well as the 1Q/1H compounds are discussed. It is found that as m increases, the x-ray photoemission threshold or the Fermi energy position shifts to lower binding energy by charge transfer from a Q layer.

リンク情報
DOI
https://doi.org/10.1143/JPSJ.70.2082
CiNii Articles
http://ci.nii.ac.jp/naid/10009119622
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000170077600038&DestApp=WOS_CPL
ID情報
  • DOI : 10.1143/JPSJ.70.2082
  • ISSN : 0031-9015
  • CiNii Articles ID : 10009119622
  • Web of Science ID : WOS:000170077600038

エクスポート
BibTeX RIS