MISC

2000年6月

Diffusion behavior of sulfur in the p(1 x 1) phase of a S/Ni(111) system

SURFACE SCIENCE
  • S Tsukawaki
  • ,
  • Y Hatano
  • ,
  • K Hashizume
  • ,
  • M Sugisaki

457
1-2
開始ページ
63
終了ページ
70
記述言語
英語
掲載種別
DOI
10.1016/S0039-6028(00)00334-4
出版者・発行元
ELSEVIER SCIENCE BV

The surface phase diagram of S/Ni(111) in the temperature range from room temperature to 900 K has been established by reflection high-energy electron diffraction observations in consultation with previously reported data. The temperature dependence of surface diffusion coefficient of sulfur in a p(1 x 1) phase was measured with micro probe Auger electron microscopy from 513 to 597 K. The diffusion coefficient in the p(1 x 1) phase in the coverage region from 0.05 to 0.10 ML is expressed as: D (cm(2) s(-1)) = 2 x 10(3) exp[-1.1+/-0.1(eV)/k(B)T]. (C) 2000 Elsevier Science B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/S0039-6028(00)00334-4
CiNii Articles
http://ci.nii.ac.jp/naid/80011864298
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000087703000019&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/S0039-6028(00)00334-4
  • ISSN : 0039-6028
  • CiNii Articles ID : 80011864298
  • Web of Science ID : WOS:000087703000019

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