MISC

2018年10月

Comparing high-purity c- and m-plane GaN layers for Schottky barrier diodes grown homoepitaxially by metalorganic vapor phase epitaxy

JAPANESE JOURNAL OF APPLIED PHYSICS
  • Nagamatsu Kentaro
  • ,
  • Ando Yuto
  • ,
  • Ye Zheng
  • ,
  • Barry Ousmane
  • ,
  • Tanaka Atsushi
  • ,
  • Deki Manato
  • ,
  • Nitta Shugo
  • ,
  • Honda Yoshio
  • ,
  • Pristovsek Markus
  • ,
  • Amano Hiroshi

57
10
記述言語
英語
掲載種別
速報,短報,研究ノート等(学術雑誌)
DOI
10.7567/JJAP.57.105501

リンク情報
DOI
https://doi.org/10.7567/JJAP.57.105501
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85055269831&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85055269831&origin=inward
ID情報
  • DOI : 10.7567/JJAP.57.105501
  • ISSN : 0021-4922
  • eISSN : 1347-4065
  • SCOPUS ID : 85055269831

エクスポート
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