1993年7月
A SWITCHED-CAPACITOR CAPACITANCE MEASUREMENT CIRCUIT WITH THE VERNIER SCALE
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES
- ,
- 巻
- E76A
- 号
- 7
- 開始ページ
- 1139
- 終了ページ
- 1142
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- 出版者・発行元
- IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
To improve measurement accuracy and speed, a switched-capacitor capacitance measurement circuit with the vernier scale is developed. Its process consists of a coarse measurement by charge-balancing A-D conversion and a fine measurement by single-slope A-D conversion. A prototype using discrete components confirms the principles of operation.
- リンク情報
- ID情報
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- ISSN : 0916-8508
- eISSN : 1745-1337
- SCOPUS ID : 0027629126
- Web of Science ID : WOS:A1993LP50100014