1993年3月
FREQUENCY-RESPONSE ANALYSIS FOR THE SECONDARY-ELECTRON RELEASE BY METASTABLES IN IONIZATION CURRENT MULTIPLICATION IN N2-GAS
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
- ,
- 巻
- 62
- 号
- 3
- 開始ページ
- 948
- 終了ページ
- 958
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1143/JPSJ.62.948
- 出版者・発行元
- PHYSICAL SOC JAPAN
The effect of secondary electron emission from the cathode on the ionization current multiplication in the non-self-sustaining Townsend condition is investigated adopting the frequency response method. Measurement is carried out in N2 gas and the property of N2(A3SIGMA(u)+) metastable molecules is analysed discriminating it from other secondary processes due to ions and photons in the frequency domain. The results are consistent with the data of transient current analyses. The frequency response method may be valid for the detailed analyses of the secondary processes in the total ionization current system.
- リンク情報
- ID情報
-
- DOI : 10.1143/JPSJ.62.948
- ISSN : 0031-9015
- CiNii Articles ID : 110001955847
- Web of Science ID : WOS:A1993KT10100018