MISC

1993年3月

FREQUENCY-RESPONSE ANALYSIS FOR THE SECONDARY-ELECTRON RELEASE BY METASTABLES IN IONIZATION CURRENT MULTIPLICATION IN N2-GAS

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
  • K TSURUGIDA
  • ,
  • N IKUTA

62
3
開始ページ
948
終了ページ
958
記述言語
英語
掲載種別
DOI
10.1143/JPSJ.62.948
出版者・発行元
PHYSICAL SOC JAPAN

The effect of secondary electron emission from the cathode on the ionization current multiplication in the non-self-sustaining Townsend condition is investigated adopting the frequency response method. Measurement is carried out in N2 gas and the property of N2(A3SIGMA(u)+) metastable molecules is analysed discriminating it from other secondary processes due to ions and photons in the frequency domain. The results are consistent with the data of transient current analyses. The frequency response method may be valid for the detailed analyses of the secondary processes in the total ionization current system.

リンク情報
DOI
https://doi.org/10.1143/JPSJ.62.948
CiNii Articles
http://ci.nii.ac.jp/naid/110001955847
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:A1993KT10100018&DestApp=WOS_CPL
ID情報
  • DOI : 10.1143/JPSJ.62.948
  • ISSN : 0031-9015
  • CiNii Articles ID : 110001955847
  • Web of Science ID : WOS:A1993KT10100018

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