2013年
Experimental study of short-circuit capability of normally-off SiC-BGSITs
Materials Science Forum
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- 巻
- 740-742
- 号
- 開始ページ
- 962
- 終了ページ
- 965
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- DOI
- 10.4028/www.scientific.net/MSF.740-742.962
We investigated the short-circuit capabilities of 1.2 kV normally-off SiC buried gate static induction transistors (SiC-BGSITs). The maximum short-circuit energy was found to be 35.6 J/cm2, which is twice that of normally-on SiC-BGSITs and 3.3-5.6 times higher than that of the Si-IGBTs. The maximum short-circuit time was 590 μs. It is concluded that these high short-circuit capabilities result from saturation characteristics of the normally-off SiC-BGSITs. © (2013) Trans Tech Publications, Switzerland.
- ID情報
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- DOI : 10.4028/www.scientific.net/MSF.740-742.962
- ISSN : 0255-5476
- SCOPUS ID : 84874099874