論文

査読有り
1999年4月

The effect of surface roughness on infrared external reflection spectroscopy

VIBRATIONAL SPECTROSCOPY
  • T Hasegawa
  • ,
  • Y Kobayashi
  • ,
  • J Nishijo
  • ,
  • J Umemura

19
2
開始ページ
199
終了ページ
203
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/S0924-2031(98)00047-2
出版者・発行元
ELSEVIER SCIENCE BV

The effect of surface roughness of the back-side of a film-supporting material on Fourier transform infrared (FTIR) external reflection (ER) spectra was studied by using 9-monolayer cadmium stearate Langmuir-Blodgett (LB) films. The LB films are prepared on two infrared-transparent ZnSe substrates whose top surfaces are optically polished and bottom surfaces have controlled surface roughness with 1.2 and 0.1 mu m of protrusions, Although the roughness of 0.1 mu m is smaller than the wave-length of the infrared ray, both LB films show typical ER spectra qualitatively. On closer inspection, however, the LB film on the substrate with 0.1 mu m protrusions is irregular and the LB film on 1.2 mu m protrusions is better. These results indicate that the surface roughness of the backside of substrate is necessary for ER analyses. (C) 1999 Elsevier Science B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/S0924-2031(98)00047-2
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000080327100005&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/S0924-2031(98)00047-2
  • ISSN : 0924-2031
  • Web of Science ID : WOS:000080327100005

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