1999年4月
The effect of surface roughness on infrared external reflection spectroscopy
VIBRATIONAL SPECTROSCOPY
- ,
- ,
- ,
- 巻
- 19
- 号
- 2
- 開始ページ
- 199
- 終了ページ
- 203
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1016/S0924-2031(98)00047-2
- 出版者・発行元
- ELSEVIER SCIENCE BV
The effect of surface roughness of the back-side of a film-supporting material on Fourier transform infrared (FTIR) external reflection (ER) spectra was studied by using 9-monolayer cadmium stearate Langmuir-Blodgett (LB) films. The LB films are prepared on two infrared-transparent ZnSe substrates whose top surfaces are optically polished and bottom surfaces have controlled surface roughness with 1.2 and 0.1 mu m of protrusions, Although the roughness of 0.1 mu m is smaller than the wave-length of the infrared ray, both LB films show typical ER spectra qualitatively. On closer inspection, however, the LB film on the substrate with 0.1 mu m protrusions is irregular and the LB film on 1.2 mu m protrusions is better. These results indicate that the surface roughness of the backside of substrate is necessary for ER analyses. (C) 1999 Elsevier Science B.V. All rights reserved.
- リンク情報
- ID情報
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- DOI : 10.1016/S0924-2031(98)00047-2
- ISSN : 0924-2031
- Web of Science ID : WOS:000080327100005