2005年10月
Analysis of hydrogen-terminated Si(111) surface by infrared multiple-angle incidence resolution spectroscopy
CHEMICAL PHYSICS LETTERS
- ,
- ,
- ,
- ,
- 巻
- 415
- 号
- 1-3
- 開始ページ
- 172
- 終了ページ
- 175
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1016/j.cplett.2005.09.017
- 出版者・発行元
- ELSEVIER SCIENCE BV
The infrared multiple-angle incidence resolution spectroscopy (MAIRS) has been employed to analyze the hydrogen-terminated Si(111) 1 x 1-H surface. The new technique of infrared MAIRS provides two absorption spectra simultaneously on an identical sample, which separately reveal the surface-parallel and surface-normal vibration spectra. It has been exhibited in the present study that the infrared MAIRS technique is powerful to discuss some infrared key bands in terms of molecular orientation concerned with Si-H vibrational modes on the Si(111) 1 x 1-H surface with the use of the two spectra. (c) 2005 Elsevier B.V. All rights reserved.
- リンク情報
- ID情報
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- DOI : 10.1016/j.cplett.2005.09.017
- ISSN : 0009-2614
- Web of Science ID : WOS:000232796100034