1999年
Detection of surface-plasmon evanescent fields using a metallic probe tip covered with fluorescence
Review of Scientific Instruments
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- 巻
- 70
- 号
- 10
- 開始ページ
- 3962
- 終了ページ
- 3966
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1063/1.1150020
- 出版者・発行元
- American Institute of Physics Inc.
A new experimental system has been constructed to detect evanescent fields of metal surface plasmons (SPs) using a metallic probe tip covered with fluorescence cadmium sulfide (CdS). The evanescent fields of the SPs sensitive to the metal interfaces were observed as fluorescent light from CdS on the tip. No additional lock-in detection technique with a vibrating probe tip is necessary in the system, in spite of the scattered light enhanced by SP due to the surface roughness. The fluorescent light measured for the Al film sample shows exponential decay with distance from the sample surface, indicating that the SP evanescent fields are detected with our apparatus. © 1999 American Institute of Physics.
- リンク情報
- ID情報
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- DOI : 10.1063/1.1150020
- ISSN : 0034-6748
- SCOPUS ID : 0037737024