1997年3月10日
Ar+-ion impact desorption of Au and Ag from the Si(111)-(2√3 × 2√3)-(Au,Ag) surface
Surface Science
- ,
- ,
- ,
- 巻
- 374
- 号
- 1-3
- 開始ページ
- 306
- 終了ページ
- 318
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1016/S0039-6028(97)01217-X
- 出版者・発行元
- Elsevier
The change of Au and Ag coverages at the Si(111)-(2√3 × 2√3)-(Au,Ag) surface by 5 keV Ar+-ion bombardment has been measured by means of AES and RBS techniques in order to determine the potential barrier heights for their desorption and recoil implantation. The cross-section for recoil implantation of Au is 2.5 times larger than that of Au at the Si(111)-(√3 × √3)-Au surface, while that of Ag is smaller than that of Ag at the Si(111)-(√3 × √3)-Ag surface. The cross-section for desorption of Au is also larger than that at the Si(111)-(√3 × √3)-Au surface, arid that of Ag is smaller than that at the Si(111)-(√3 × √3)-Ag surface. It is concluded from the recoil-implantation cross-section data that Ag atoms are located on the Au layer of the double-layer structure. From the analysis of these cross-sections, the potential barrier heights for recoil-implantation and desorption are evaluated to be 4.2±0.4 and 4.2±0.8 eV for Au and 0.33±0.17 and 3.6±0.7 eV for Ag. © 1997 Elsevier Science B.V. All rights reserved.
- ID情報
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- DOI : 10.1016/S0039-6028(97)01217-X
- ISSN : 0039-6028
- SCOPUS ID : 0031094572