2017年12月1日
Charge-density study on layered oxyarsenides (Lao)MAs (M = Mn, Fe, Ni, Zn)
Applied Physics Express
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- 巻
- 10
- 号
- 12
- 開始ページ
- 123001
- 終了ページ
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.7567/APEX.10.123001
- 出版者・発行元
- Japan Society of Applied Physics
Using synchrotron X-ray powder diffraction, we investigate the charge-density distributions of the layered oxypnictides (LaO)MnAs, (LaO)FeAs, (LaO)NiAs, and (LaO)ZnAs, which are an antiferromagnetic semiconductor, a parent material of an iron-based superconductor, a low-temperature superconductor, and a non-magnetic semiconductor, respectively. For the metallic samples, clear charge densities are observed in both the transition-metal pnictide layers and the rare-earth-oxide layers. However, in the semiconducting samples, there is no finite charge density between the transition-metal element and As. These differences in charge density reflect differences in physical properties. First-principles calculations using density functional theory reproduce the experimental results reasonably well.
- リンク情報
- ID情報
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- DOI : 10.7567/APEX.10.123001
- ISSN : 1882-0786
- ISSN : 1882-0778
- eISSN : 1882-0786
- SCOPUS ID : 85039986944