論文

査読有り
2013年6月

Structural Analysis of Nano Structured Carbon by Transmission Electron Microscopy and Image Processing

Applied Surface Science
  • K. Oshida
  • M. Murata
  • K. Fujiwara
  • T. Itaya
  • T. Yanagisawa
  • K. Kimura
  • T. Nakazawa
  • Y. A. Kim
  • M. Endo
  • B. -H. Kim
  • K. S. Yang
  • 全て表示

275
開始ページ
409
終了ページ
412
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.apsusc.2012.10.137
出版者・発行元
ELSEVIER SCIENCE BV

Transmission electron microscopy (TEM) is one of the highest resolution analysis methods of materials. The three dimensional recognition of the materials is difficult by TEM because the observation data is projection images through the materials. In this study, space structure of carbon nanotubes loaded with metal particles was analyzed by three dimensional TEM (3D-TEM) [1,2]. The nano structured carbons are also observed by high resolution transmission electron microscopy (HRTEM) with Cs corrector. Cup-stack type carbon nanotubes (CSCNTs) loaded with Pt particles (2-3 nm in diameter) prepared by GSI Creos Corporation were analyzed by these methods. Pt particles are bound selectively to the edges of hexagonal carbon layers of inside and outer surface of CSCNTs efficiently and can be expected to work well as catalysts of electrodes of fuel cell. It is sometimes difficult that the nano sized area is analyzed by selected area electron diffraction (SAD) because the selected area aperture cannot be so small. The HRTEM and image processing technique give similar results of SAD when it works and revealed to be useful to analyze nano structured carbons. (c) 2012 Elsevier B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.apsusc.2012.10.137
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000318977300063&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.apsusc.2012.10.137
  • ISSN : 0169-4332
  • eISSN : 1873-5584
  • Web of Science ID : WOS:000318977300063

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