Misc.

Jul 10, 2014

Comparison of Electromagnetic Injection Configurations in terms of Induced Disturbance Observed near Integrated Circuit on Board

IEICE technical report. Electromagnetic compatibility
  • MAESHIMA Kazuhiro
  • ,
  • IOKIBE Kengo
  • ,
  • WATANABE Tetsushi
  • ,
  • TOYOTA Yoshitaka

Volume
114
Number
129
First page
31
Last page
36
Language
Japanese
Publishing type
Publisher
The Institute of Electronics, Information and Communication Engineers

In this paper, the authors observed noise induced by electromagnetic disturbance injection in several experimental configurations. The noise was measured on a printed circuit board (PCB) as voltage variations of DC bias and the clock signal. The noise observation is in the course of understanding how the disturbance is conducted into the PCB in the immunity test. The experimental system here consisted of an electrical fast transient/ burst (EFT/B) generator, a coupler and a PCB implementing FPGAs. A Coupling Decoupling Network (CDN) or a current probe was used as the coupler. Experimental results indicated that positive pulse injection fluctuated the power bias voltage of the FPGA and that noise waveforms were varied with the coupler. The waveform variation with coupler suggested that it changed the input impedance of the experimental system at the EFT/B generator. It is also observed that a grounding vanished an oscillating noise in a constant frequency when the PCB ground was shunted to the system ground.

Link information
CiNii Articles
http://ci.nii.ac.jp/naid/110009947075
CiNii Books
http://ci.nii.ac.jp/ncid/AN10013108
URL
http://id.ndl.go.jp/bib/025634003
ID information
  • ISSN : 0913-5685
  • CiNii Articles ID : 110009947075
  • CiNii Books ID : AN10013108

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