Misc.

Jul 20, 2006

Determination of impedances in LECCS-I/O model by 3-port VNA measurement for higher frequency range

IEICE technical report
  • OSAKI Akihiro
  • ,
  • IOKIBE Kengo
  • ,
  • TOYOTA Yoshitaka
  • ,
  • KOGA Ryuji
  • ,
  • WADA Osami

Volume
106
Number
182
First page
17
Last page
22
Language
Japanese
Publishing type
Publisher
The Institute of Electronics, Information and Communication Engineers

This report discusses impedance determination of a linear equivalent circuit (LEC) in an EMC macro model, LECCS I/O. The 2-port LECCS I/O model the authors had proposed based on 2-port measurement by a vector network analyzer (VNA) was found to be affected by an external circuit connected to the input terminals of CMOS gates. To remove the defect, this report investigated a 3-port LECCS I/O model with 3-port VNA. The 3-port model includes the input circuit of CMOS gates and the three ports of the model mean the power-supply terminal, the output terminal, and the input terminal to the ground terminal. The proposed 3-port model with 3-port VNA was used for power-ground impedance simulation by changing the impedances of external input and output circuits. As a result, the impedance simulation was in good agreement with measurements in higher frequency range compared with the previous 2-port model with 2-port VNA.

Link information
CiNii Articles
http://ci.nii.ac.jp/naid/110004833244
CiNii Books
http://ci.nii.ac.jp/ncid/AN10013108
URL
http://id.ndl.go.jp/bib/8016552
ID information
  • ISSN : 0913-5685
  • CiNii Articles ID : 110004833244
  • CiNii Books ID : AN10013108

Export
BibTeX RIS