論文

査読有り
2012年

Insertion of Parallel RL Circuits into Power Distribution Network for Simultaneous Switching Current Reduction and Power Integrity

2012 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC)
  • Kengo Iokibe
  • ,
  • Yusuke Yano
  • ,
  • Yoshitaka Toyota

開始ページ
417
終了ページ
420
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
出版者・発行元
IEEE

We investigated a method using parallel RL circuits inserted into power distribution network (PDN) of integrated circuits (ICs) to enhance the IC in EMI and PI performance. Optimal damping resistances of the parallel RL circuit were derived from a characteristic equation of an equivalent circuit of a partial PDN that contributed to PDN resonances dominantly. The parallel RL circuit with the optimal resistances damps the PDN resonances as quickly as possible and reduces peaks in simultaneous switching current that will cause EMI and in input impedance of PDN related to PI. We validated the parallel RL circuit with respect to EMI and PI performance of ICs numerically and experimentally. Results of these validation showed that the proposed method descend the simultaneous switching current at both chip-package-board and on-board resonant frequency. It is also confirmed that insertion of the parallel RL circuits into the power trace reduced the impedance peak due to the chip-package-board resonance.

リンク情報
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000320645900104&DestApp=WOS_CPL
ID情報
  • ISSN : 2162-7673
  • Web of Science ID : WOS:000320645900104

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