2018年5月1日
Geometrical contribution to the anomalous Nernst effect in TbFeCo thin films
AIP Advances
- ,
- 巻
- 8
- 号
- 5
- 開始ページ
- 056326-1
- 終了ページ
- 056326-6
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1063/1.5006210
- 出版者・発行元
- American Institute of Physics Inc.
The geometrical contribution to the anomalous Nernst effect in magnetic thin films was experimentally investigated by varying the aspect ratios and electrode configurations. The bar-Type electrode configuration induces a short-circuit current near both edges of electrodes and decreases the effective Nernst voltage, while the point-contact (PC) electrode exploits the intrinsic Nernst voltage. In a sample with PC electrodes, as the sample width along the transverse direction of the thermal flow increases, the Nernst voltage increases monotonically. Thus, a much wider element with PC electrodes enables us to bring out a larger Nernst voltage by utilizing perpendicularly magnetized thin films.
- リンク情報
- ID情報
-
- DOI : 10.1063/1.5006210
- ISSN : 2158-3226
- SCOPUS ID : 85040938608