論文

査読有り
2021年5月

Analytical Formulation of Copper Loss of Litz Wire With Multiple Levels of Twisting Using Measurable Parameters

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
  • Kazuhiro Umetani
  • ,
  • Shota Kawahara
  • ,
  • Jesus Acero
  • ,
  • Hector Sarnago
  • ,
  • Oscar Lucia
  • ,
  • Eiji Hiraki

57
3
開始ページ
2407
終了ページ
2420
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1109/TIA.2021.3063993
出版者・発行元
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Litz wire has been widely utilized in power transformers and inductors as a wire with low copper loss at high-frequency operation. The Litz wire is commonly made of many thin isolated strands twisted in multiple levels. Due to its complicated structure, the copper loss prediction of the Litz wire has been difficult, hindering the design optimization of the Litz wire structure. To overcome this difficulty, preceding studies have investigated the analytical copper loss models of the constituting elements of the Litz wire, i.e., the strands and the bundles of strands. The purpose of this article is to propose an analytical copper loss model of the Litz wire by utilizing these preceding knowledge. The proposed model is formulated only with parameters that can be measured by basic testing instruments. Besides, the proposed model considers the bundle structure of the Litz wire, which affects the local ac current distribution, and the twisting pitch, which causes the inclination of the Litz wire strands. The proposed model was tested by comparing the analytical prediction and experimental measurements of the ac resistance of commercially available Litz wires. As a result, the predicted ac resistance showed good agreement with the measured ac resistance, suggesting the appropriateness of the proposed model.

リンク情報
DOI
https://doi.org/10.1109/TIA.2021.3063993
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000654816500048&DestApp=WOS_CPL
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85102320680&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85102320680&origin=inward
ID情報
  • DOI : 10.1109/TIA.2021.3063993
  • ISSN : 0093-9994
  • eISSN : 1939-9367
  • SCOPUS ID : 85102320680
  • Web of Science ID : WOS:000654816500048

エクスポート
BibTeX RIS