MISC

2010年2月

Fine-structure characteristics in the emittance images of a strongly focusing He+ beam

REVIEW OF SCIENTIFIC INSTRUMENTS
  • M. Sasao
  • ,
  • T. Kobuchi
  • ,
  • M. Kisaki
  • ,
  • H. Takahashi
  • ,
  • A. Okamoto
  • ,
  • S. Kitajima
  • ,
  • O. Kaneko
  • ,
  • K. Tsumori
  • ,
  • K. Shinto
  • ,
  • M. Wada

81
2
開始ページ
02B115-
終了ページ
記述言語
英語
掲載種別
DOI
10.1063/1.3277211
出版者・発行元
AMER INST PHYSICS

The phase space distribution of a strongly focused He+ ion beam source equipped with concave multiaperture electrodes was measured using a pepper-pot plate and a Kapton foil. The substructure of 301 merging He beamlets was clearly observed on a footprint of pepper-pot hole at the beam waist, where the beam density was 500 mA/cm(2). The position and the width of each beamlet substructure show the effect of interference of beamlets with surrounding one.

リンク情報
DOI
https://doi.org/10.1063/1.3277211
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000275028400160&DestApp=WOS_CPL
ID情報
  • DOI : 10.1063/1.3277211
  • ISSN : 0034-6748
  • eISSN : 1089-7623
  • Web of Science ID : WOS:000275028400160

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