2010年2月
Fine-structure characteristics in the emittance images of a strongly focusing He+ beam
REVIEW OF SCIENTIFIC INSTRUMENTS
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- 巻
- 81
- 号
- 2
- 開始ページ
- 02B115-
- 終了ページ
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1063/1.3277211
- 出版者・発行元
- AMER INST PHYSICS
The phase space distribution of a strongly focused He+ ion beam source equipped with concave multiaperture electrodes was measured using a pepper-pot plate and a Kapton foil. The substructure of 301 merging He beamlets was clearly observed on a footprint of pepper-pot hole at the beam waist, where the beam density was 500 mA/cm(2). The position and the width of each beamlet substructure show the effect of interference of beamlets with surrounding one.
- リンク情報
- ID情報
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- DOI : 10.1063/1.3277211
- ISSN : 0034-6748
- eISSN : 1089-7623
- Web of Science ID : WOS:000275028400160