2012年2月
Analysis of buried heterointerfacial hydrogen in highly lattice-mismatched epitaxy on silicon
THIN SOLID FILMS
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- 巻
- 520
- 号
- 8
- 開始ページ
- 3300
- 終了ページ
- 3303
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1016/j.tsf.2011.10.081
- 出版者・発行元
- ELSEVIER SCIENCE SA
We realized the epitaxial growth of a Sr layer on Si(111) with an atomically abrupt heterointerface - in spite of its large lattice mismatch (12%) with Si - by introducing a monoatomic layer of H on Si. In order to identify the buried H, we carried out a combination analysis involving neutron reflectometry and resonant nuclear reaction of H-1(N-15,alpha gamma)C-12 analysis. We found different neutron reflectivity profiles resulting from a contrast variation between the H and D atoms at the buried heterointerface. Furthermore, the depth gamma-ray intensity profiles revealed that the H at the heterointerface acts as an effective buffer layer that enables it to manage the highly mismatched epitaxy on Si. (C) 2011 Elsevier B. V. All rights reserved.
- リンク情報
- ID情報
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- DOI : 10.1016/j.tsf.2011.10.081
- ISSN : 0040-6090
- ORCIDのPut Code : 35450841
- Web of Science ID : WOS:000301710800037