論文

査読有り
2012年2月

Analysis of buried heterointerfacial hydrogen in highly lattice-mismatched epitaxy on silicon

THIN SOLID FILMS
  • T. Yamazaki
  • ,
  • H. Asaoka
  • ,
  • T. Taguchi
  • ,
  • S. Yamamoto
  • ,
  • D. Yamazaki
  • ,
  • R. Maruyama
  • ,
  • M. Takeda
  • ,
  • S. Shamoto

520
8
開始ページ
3300
終了ページ
3303
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.tsf.2011.10.081
出版者・発行元
ELSEVIER SCIENCE SA

We realized the epitaxial growth of a Sr layer on Si(111) with an atomically abrupt heterointerface - in spite of its large lattice mismatch (12%) with Si - by introducing a monoatomic layer of H on Si. In order to identify the buried H, we carried out a combination analysis involving neutron reflectometry and resonant nuclear reaction of H-1(N-15,alpha gamma)C-12 analysis. We found different neutron reflectivity profiles resulting from a contrast variation between the H and D atoms at the buried heterointerface. Furthermore, the depth gamma-ray intensity profiles revealed that the H at the heterointerface acts as an effective buffer layer that enables it to manage the highly mismatched epitaxy on Si. (C) 2011 Elsevier B. V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.tsf.2011.10.081
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000301710800037&DestApp=WOS_CPL
URL
http://orcid.org/0000-0002-9460-2357
ID情報
  • DOI : 10.1016/j.tsf.2011.10.081
  • ISSN : 0040-6090
  • ORCIDのPut Code : 35450841
  • Web of Science ID : WOS:000301710800037

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