2012年5月
Work function shifts of catalytic metals under hydrogen gas visualized by terahertz chemical microscopy
OPTICS EXPRESS
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- 巻
- 20
- 号
- 11
- 開始ページ
- 11637
- 終了ページ
- 11642
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1364/OE.20.011637
- 出版者・発行元
- OPTICAL SOC AMER
Terahertz chemical microscopy (TCM) was applied to visualize the distribution of the work function shift of catalytic metals under hydrogen gas. TCM measures the chemical potential on the surface of a SiO2/Si/sapphire sensing plate without any contact with the plate. By controlling the bias voltage between an electrode on the SiO2 surface and the Si layer, the relationship between the voltage and the THz amplitude from the sensing plate can be obtained. As a demonstration, two types of structures were fabricated on the sensing plate, and the work function shifts due to catalytic reactions were visualized. (C) 2012 Optical Society of America
- リンク情報
- ID情報
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- DOI : 10.1364/OE.20.011637
- ISSN : 1094-4087
- Web of Science ID : WOS:000304403100006