論文

査読有り
2017年12月

A relationship between the force curve measured by atomic force microscopy in an ionic liquid and its density distribution on a substrate

PHYSICAL CHEMISTRY CHEMICAL PHYSICS
  • Ken-ichi Amano
  • ,
  • Yasuyuki Yokota
  • ,
  • Takashi Ichii
  • ,
  • Norio Yoshida
  • ,
  • Naoya Nishi
  • ,
  • Seiji Katakura
  • ,
  • Akihito Imanishi
  • ,
  • Ken-ichi Fukui
  • ,
  • Tetsuo Sakka

19
45
開始ページ
30504
終了ページ
30512
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1039/c7cp06948k
出版者・発行元
ROYAL SOC CHEMISTRY

An ionic liquid forms a characteristic solvation structure on a substrate. For example, when the surface of the substrate is negatively or positively charged, cation and anion layers are alternately aligned on the surface. Such a solvation structure is closely related to slow diffusion, high electric capacity, and chemical reactions at the interface. To analyze the periodicity of the solvation structure, atomic force microscopy is often used. The measured force curve is generally oscillatory and its characteristic oscillation length corresponds not to the ionic diameter, but to the ion-pair diameter. However, the force curve is not the solvation structure. Hence, it is necessary to know the relationship between the force curve and the solvation structure. To find physical essence in the relationship, we have used statistical mechanics of a simple ionic liquid. We found that the basic relationship can be expressed by a simple equation and the reason why the oscillation length corresponds to the ion-pair diameter. Moreover, it is also found that Derjaguin approximation is applicable to the ionic liquid system.

リンク情報
DOI
https://doi.org/10.1039/c7cp06948k
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000416054400021&DestApp=WOS_CPL
ID情報
  • DOI : 10.1039/c7cp06948k
  • ISSN : 1463-9076
  • eISSN : 1463-9084
  • Web of Science ID : WOS:000416054400021

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