2016年
In-situ X-ray diffraction during tensile deformation of ultrafine-grained copper using synchrotron radiation
PHILOSOPHICAL MAGAZINE LETTERS
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- 巻
- 96
- 号
- 8
- 開始ページ
- 294
- 終了ページ
- 304
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1080/09500839.2016.1218563
- 出版者・発行元
- TAYLOR & FRANCIS LTD
At the synchrotron facility, Super Photon Ring - 8GeV, in-situ X-ray diffraction during tensile deformation was conducted on ultrafine-grained Cu with a grain size of about 300nm fabricated by equal-channel angular pressing. The diffraction profile was observed with the time resolution of about 1 s using multiple MYTHEN detectors, and the diffraction angle and the full-width at half-maximum of some Bragg peaks were determined using the pseudo-Voigt function. From the analysis of Bragg peaks, it was found out that there are microscopically three regions; elastic, plastic and transition regions. The 0.2% proof stress obtained from the stress-strain curve locates within the microscopic transition region. Microstrain was evaluated using the Williamson-Hall method and the dislocation density was also obtained from the microstrain. The dislocation density starts increasing before 0.2% proof stress, which is associated with dislocation bow-out and emission from grain boundaries. The Taylor relationship seems to be still satisfied after 0.2% proof stress.
- リンク情報
- ID情報
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- DOI : 10.1080/09500839.2016.1218563
- ISSN : 0950-0839
- eISSN : 1362-3036
- Web of Science ID : WOS:000383022400002