2019年5月24日

# Atomic resolution electron microscopy in a magnetic field free environment

Nature Communications
• N. Shibata
• ,
• Y. Kohno
• ,
• A. Nakamura
• ,
• S. Morishita
• ,
• T. Seki
• ,
• A. Kumamoto
• ,
• ,
• T. Matsumoto
• ,
• S. D. Findlay
• ,
• Y. Ikuhara

10

2308

DOI
10.1038/s41467-019-10281-2

© 2019, The Author(s). Atomic-resolution electron microscopes utilize high-power magnetic lenses to produce magnified images of the atomic details of matter. Doing so involves placing samples inside the magnetic objective lens, where magnetic fields of up to a few tesla are always exerted. This can largely alter, or even destroy, the magnetic and physical structures of interest. Here, we describe a newly developed magnetic objective lens system that realizes a magnetic field free environment at the sample position. Combined with a higher-order aberration corrector, we achieve direct, atom-resolved imaging with sub-Å spatial resolution with a residual magnetic field of less than 0.2 mT at the sample position. This capability enables direct atom-resolved imaging of magnetic materials such as silicon steels. Removing the need to subject samples to high magnetic field environments enables a new stage in atomic resolution electron microscopy that realizes direct, atomic-level observation of samples without unwanted high magnetic field effects.

リンク情報
DOI
https://doi.org/10.1038/s41467-019-10281-2

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