論文

査読有り
2019年5月24日

Atomic resolution electron microscopy in a magnetic field free environment

Nature Communications
  • N. Shibata
  • ,
  • Y. Kohno
  • ,
  • A. Nakamura
  • ,
  • S. Morishita
  • ,
  • T. Seki
  • ,
  • A. Kumamoto
  • ,
  • H. Sawada
  • ,
  • T. Matsumoto
  • ,
  • S. D. Findlay
  • ,
  • Y. Ikuhara

10
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2308
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研究論文(学術雑誌)
DOI
10.1038/s41467-019-10281-2

© 2019, The Author(s). Atomic-resolution electron microscopes utilize high-power magnetic lenses to produce magnified images of the atomic details of matter. Doing so involves placing samples inside the magnetic objective lens, where magnetic fields of up to a few tesla are always exerted. This can largely alter, or even destroy, the magnetic and physical structures of interest. Here, we describe a newly developed magnetic objective lens system that realizes a magnetic field free environment at the sample position. Combined with a higher-order aberration corrector, we achieve direct, atom-resolved imaging with sub-Å spatial resolution with a residual magnetic field of less than 0.2 mT at the sample position. This capability enables direct atom-resolved imaging of magnetic materials such as silicon steels. Removing the need to subject samples to high magnetic field environments enables a new stage in atomic resolution electron microscopy that realizes direct, atomic-level observation of samples without unwanted high magnetic field effects.

リンク情報
DOI
https://doi.org/10.1038/s41467-019-10281-2

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