2019年7月

# High contrast STEM imaging for light elements by an annular segmented detector

ULTRAMICROSCOPY
• Kousuke Ooe
• ,
• Takehito Seki
• ,
• Yuichi Ikuhara
• ,
• Naoya Shibata

202

148

155

DOI
10.1016/j.ultramic.2019.04.011

ELSEVIER SCIENCE BV

Annular bright-field scanning transmission electron microscopy (ABF STEM) has been actively used to directly observe the light element atoms inside materials and devices. However, the detector angle condition for conventional ABF STEM has been empirically selected and thus is not always optimized for observing ultra-light element atoms such as hydrogen and lithium atoms. In this study, the detector conditions for ABF STEM were reexamined by calculating a new type of phase contrast transfer function (PCTF) for an annularly segmented detector to maximize the image contrast of ultra-light element atoms such as lithium. Using this new PCTF, an improved detector geometry for observing lithium atoms is demonstrated, which is confirmed by the image simulations and experiments in several types of lithium cathode materials.

Web of Science ® 被引用回数 : 3

リンク情報
DOI
https://doi.org/10.1016/j.ultramic.2019.04.011
Web of Science