論文

査読有り
2019年7月

High contrast STEM imaging for light elements by an annular segmented detector

ULTRAMICROSCOPY
  • Kousuke Ooe
  • ,
  • Takehito Seki
  • ,
  • Yuichi Ikuhara
  • ,
  • Naoya Shibata

202
開始ページ
148
終了ページ
155
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.ultramic.2019.04.011
出版者・発行元
ELSEVIER SCIENCE BV

Annular bright-field scanning transmission electron microscopy (ABF STEM) has been actively used to directly observe the light element atoms inside materials and devices. However, the detector angle condition for conventional ABF STEM has been empirically selected and thus is not always optimized for observing ultra-light element atoms such as hydrogen and lithium atoms. In this study, the detector conditions for ABF STEM were reexamined by calculating a new type of phase contrast transfer function (PCTF) for an annularly segmented detector to maximize the image contrast of ultra-light element atoms such as lithium. Using this new PCTF, an improved detector geometry for observing lithium atoms is demonstrated, which is confirmed by the image simulations and experiments in several types of lithium cathode materials.

Web of Science ® 被引用回数 : 3

リンク情報
DOI
https://doi.org/10.1016/j.ultramic.2019.04.011
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000469204600019&DestApp=WOS_CPL

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