論文

査読有り 筆頭著者
2018年11月

Integrated contrast-transfer-function for aberration-corrected phase-contrast STEM

ULTRAMICROSCOPY
  • Takehito Seki
  • ,
  • Naoto Takanashi
  • ,
  • Eiji Abe

194
開始ページ
193
終了ページ
198
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.ultramic.2018.08.008
出版者・発行元
ELSEVIER SCIENCE BV

We describe the optical conditions that are essentially necessary for phase-contrast imaging with aberration-corrected scanning transmission electron microscopy (STEM), whose depth of field has reached almost comparable to the specimen thickness. For such state-of-the-art STEM, contrast-transfer-function (CTF) should be defined not solely for the projected potential but multiply for each wavefront during the beam propagation across the specimen thickness; an integration of multiple CTFs (iCTF). We show that the iCTF concept explains fairly well characteristic annular-bright-field (ABF) imaging behaviors of heavy/light atom sites against the defocus changes, and also provide notable concerns on possible artifacts that arise from different imaging-depth dependences between the heavy/light atom sites.

Web of Science ® 被引用回数 : 5

リンク情報
DOI
https://doi.org/10.1016/j.ultramic.2018.08.008
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000450281700022&DestApp=WOS_CPL

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