論文

査読有り
2018年9月

Probing the Internal Atomic Charge Density Distributions in Real Space

ACS NANO
  • Gabriel Sanchez-Santolino
  • ,
  • Nathan R. Lugg
  • ,
  • Takehito Seki
  • ,
  • Ryo Ishikawa
  • ,
  • Scott D. Findlay
  • ,
  • Yuji Kohno
  • ,
  • Yuya Kanitani
  • ,
  • Shinji Tanaka
  • ,
  • Shigetaka Tomiya
  • ,
  • Yuichi Ikuhara
  • ,
  • Naoya Shibata

12
9
開始ページ
8875
終了ページ
8881
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1021/acsnano.8b03712
出版者・発行元
AMER CHEMICAL SOC

Probing the charge density distributions in materials at atomic scale remains an extremely demanding task, particularly in real space. However, recent advances in differential phase contrast-scanning transmission electron microscopy (DPC-STEM) bring this possibility closer by directly visualizing the atomic electric field. DPC-STEM at atomic resolutions measures how a sub-angstrom electron probe passing through a material is affected by the atomic electric field, the field between the nucleus and the surrounding electrons. Here, we perform a fully quantitative analysis which allows us to probe the charge density distributions inside atoms, including both the positive nuclear and the screening electronic charges, with subatomic resolution and in real space. By combining state-of-the-art DPC-STEM experiments with advanced electron scattering simulations we are able to map the spatial distribution of the electron cloud within individual atomic columns. This work constitutes a crucial step toward the direct atomic scale determination of the local charge redistributions and modulations taking place in materials systems.

Web of Science ® 被引用回数 : 8

リンク情報
DOI
https://doi.org/10.1021/acsnano.8b03712
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000445972400006&DestApp=WOS_CPL

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