論文

査読有り 筆頭著者
2018年10月

Theoretical framework of statistical noise in scanning transmission electron microscopy

ULTRAMICROSCOPY
  • Takehito Seki
  • ,
  • Yuichi Ikuhara
  • ,
  • Naoya Shibata

193
開始ページ
118
終了ページ
125
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.ultramic.2018.06.014
出版者・発行元
ELSEVIER

Statistical noise, or shot noise, dominates experimental image quality in scanning transmission electron microscopy because efficiencies of recent detectors are close to ideal. We establish a general framework for the statistical noise taking into account two random processes in the electron incidence and the electron scattering. Using this framework, in terms of signal-to-noise ratio, we evaluate several STEM coherent imaging techniques: annular bright field, enhanced annular bright field, differential phase contrast, and ptychography and show that ptychography is the most efficient imaging for weak phase objects. Moreover, we find that normalizing annular-bright-field image by total electron count in the bright field significantly suppress the noise.

Web of Science ® 被引用回数 : 16

リンク情報
DOI
https://doi.org/10.1016/j.ultramic.2018.06.014
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000444834300014&DestApp=WOS_CPL

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